X-ray-diffraction study of size-dependent strain in quantum-wire structures.
نویسندگان
چکیده
We report a synchrotron x-ray-diffraction study of the strain field in embedded In0.2Ga0.8As/GaAs ~001! quantum wires of widths 50–250 nm. Our results show a size-dependent orthorhombic lattice deformation in the wires and a linearly strained interfacial region near the wire sidewalls. The measured strain is responsible for an unusual band-gap energy increase that is several times larger than the quantum confinement effect, indicating that strain effects contribute significantly to band-edge energies in this and other quantum structures. @S0163-1829~96!00948-4#
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ورودعنوان ژورنال:
- Physical review. B, Condensed matter
دوره 54 23 شماره
صفحات -
تاریخ انتشار 1996